As the complexity of IOL designs increases, metrology tools must become more powerful and effective to overcome new challenges, especially with the rise of Extended depth of focus (EDoF) IOL. Until recently, the ModelEye historically available in NIMO (Mathematical model base on the summing of the wavefront of the IOL and the wavefront of a synthetic cornea) was perfectly appropriate. However, this method faces limitations for larger apertures and when the IOL and synthetic cornea show aberrations.
🆕Lambda-X’s new Non-Paraxial Model Eye overcomes these issues by accounting for the focusing effect of the model eye and therefore the incident light entering the IOL not being collimated.
The patent pending Non-Paraxial Model Eye implemented in IOL-MENTOR® opens way to more efficient measurements of complex refractive optics with waveÂfront sensors in IOL metrology for both R&D studies and producÂtion quality check.
Since the model has been fully validated for measurements of lenses in-air and In-Situ, the operation is simpler, more consistent, beneficial to IOL manufacÂturers and ultimately contributes to a better vision for the patient.
📧 Contact our Ophthalmics department to know more!